Hybrid De-embedding Technique for Microwave Absorber Characterization

Achmad Munir

Abstract


In this paper, a data processing technique to obtain the true characteristic of microwave absorber material characterization is proposed. This technique addressed to overcome the limitations of port extension is known as hybrid de-embedding technique, which in principle is carried out by combining the structure model data of test fixture that is used with simulated data or experimental measurements. In this technique, the test fixture is simulated numerically to get S (scattering) parameter data. Then the S parameter is converted into the T parameter (transfer) to be used for de-embedding process by removing the characteristic of test fixture used so that the true characteristics of a microwave absorber material can be revealed. To verify the accuracy of technique proposed, the characteristics of a microwave absorber is simulated numerically and measured experimentally. The simulation and measurements results are then processed using the proposed technique to be compared with its ideal model. In general, the result of de-embedding process shows that the proposed technique has high accuracy.


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References


Goldstein C, Tehori A. A Small Parallel Plates System for EMP Simulation. Proceeding of IEEE Symposium on EMC. Atlanta. 1987; 135-138.

Philips B, Parker EA, Langley RJ. Active FSS in An Experimental Horn Antenna Switchable Between Two Beamwidths. Electronics Letters. 1995: 31(1): 1-2.

Hansen RC. Phased Array Antennas. John Wiley & Sons. 2002: 127-163.

Bauer RF, Penfield JR P. De-embedding and Unterminating. IEEE Transaction on Microwave Theory and Techniques. 1974; MTT-22(3): 282-288.

Rosenbaum SE, Pitzalis O, Marzan JM. A Calibration Method for Deembedding a Microwave Test Fixture. Proceeding of Automatic RF Techniques Group (ARFTG) Conference Digest. Baltimore. 1986: 148-158.

Mondal J, Chen T-H. Propagation Constant Determination in Microwave Fixture De- embedding Procedure. IEEE Transaction on Microwave Theory and Techniques. 1988; 36(4): 706-714.

Vandamme EP, Schreurs DMMP, Dinther CV. Improved Three-step De-embedding Method to Accurately Account for The Influence of Pad Parasitics in Silicon On-wafer RF Test-Structures,” IEEE Transaction on Microwave Theory and Techniques. 2001; 48(4): 737-742.

Farina M, Rozzi T. A Short-Open De-embedding Technique for Method-of-Moments-Based Electromagnetic Analyses. IEEE Transaction on Microwave Theory and Techniques. 2001; 49(4): 624-628.

De-embedding and Embedding S-Parameter Networks Using a Vector Network Analyzer. Agilent Application Note. 1364-1; 2004.

Munir A, Fusco V, Malyuskin O. Parallel Plate Waveguide Simulator Design, Characterisation and DUT De-embedding. Proceeding of IEEE International Symposium on Antennas and Propagation (AP-S). San Diego. 2008: 1-4.

Munir A, Fusco V. A Hybrid De-embedding Technique and Its Application for FSS Characterization. Proceeding of Asia-Pacific Microwave Conference (APMC). Hongkong. 2008; 1-4.

Munir A, Fusco V. Effect of Surface Resistor Loading on High Impedance Surface Radar Absorber Return Loss and Bandwidth. Microwave and Optical Technology Letters. 2009; 51(7): 1773-1775.

Collin RE. Foundations for Microwave Engineering. McGraw-Hill. 1992: 257-260.




DOI: http://doi.org/10.12928/telkomnika.v9i1.679

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