Zain, AS Mohd, Universiti Teknikal Malaysia Melaka (UTeM), Malaysia

• Vol 17, No 6: December 2019 - Electronics
  Impact of Gouy-Chapman-Stern model on conventional ISFET sensitivity and stability
  Abstract  PDF
• Vol 17, No 6: December 2019 - Electronics
  Performance analysis of high-k materials as stern layer in ion-sensitive field effect transistor using commercial TCAD
  Abstract  PDF

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