Ravi, S, VIT UNIVERSITY, India
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Vol 14, No 4: December 2016 - Electronics
A Soft Error Study on Tri-gate based FinFET and Junctionless-FinFET 6T SRAM Cell – A Comparison
Abstract
TELKOMNIKA Telecommunication, Computing, Electronics and Control
ISSN: 1693-6930, e-ISSN: 2302-9293
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